Skipper charge-coupled devices (CCDs) are ultralow-threshold detectors capable of detecting energy deposits in silicon at the electronvolt scale. Skipper CCDs are increasingly used in rare-event searches, including experiments such as SENSEI, DAMIC-M, Oscura, and CONNIE, where one of the major challenges is mitigating low-energy backgrounds. In this work, we present results on trap characterization in a silicon skipper-CCD produced in the same fabrication run as the SENSEI experiment at SNOLAB. Lattice defects contribute to backgrounds in rare-event searches through single-electron charge trapping. To investigate this, we use the charge-pumping technique at different temperatures to identify dipoles produced by traps in the CCD channel. We fully characterize a fraction of these traps and use this information to extrapolate their contribution to the single-electron background in SENSEI. We find that this subpopulation of traps does not contribute significantly, but more work is...